Quantification of the Deep Discharge Induced Asymmetric Copper Deposition in Lithium‐Ion Cells by Operando Synchrotron X‐Ray Tomography
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Advanced Materials Technologies, S. 1-7
- Klassifikation
-
Elektrotechnik, Elektronik
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
Bundesanstalt für Materialforschung und -prüfung (BAM)
- (wann)
-
2024
- Urheber
-
Dayani, Shahabeddin
Markötter, Henning
Krug von Nidda, Jonas
Schmidt, Anita
Bruno, Giovanni
- DOI
-
10.1002/admt.202301246
- URN
-
urn:nbn:de:kobv:b43-592717
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:46 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Dayani, Shahabeddin
- Markötter, Henning
- Krug von Nidda, Jonas
- Schmidt, Anita
- Bruno, Giovanni
- Bundesanstalt für Materialforschung und -prüfung (BAM)
Entstanden
- 2024
Ähnliche Objekte (12)
Lettre À M. Le Rédacteur En Chef Du Journal Des Économistes sur les comptes-rendus par MM. H. Passy et Courcelle-Seneuil
Sull'orginwe della Economia Sociale ovvero teoria della storia di questa scienza. Memoria del Prof. Giovanni
Brittle Materials in Mechanical Extremes
Micro Non-Destructive Testing and Evaluation
Micro Non-Destructive Testing and Evaluation
Extending synchrotron X-ray refraction techniques to the quantitative analysis of metallic materials
Advanced Characterization and On-Line Process Monitoring of Additively Manufactured Materials and Components
Visualization of stepwise electrode decomposition in a nail penetrated commercial lithium-ion cell using low-temperature synchrotron X-ray computed tomography
3D shape analysis of powder for laser beam melting by synchrotron X-ray CT
Noise and blur removal from corrupted X-ray computed tomography scans: A multilevel and multiscale deep convolutional framework approach with synthetic training data (BAM SynthCOND)
Suppression of Cone-Beam Artefacts with Direct Iterative Reconstruction Computed Tomography Trajectories (DIRECTT)
Direct iterative reconstruction of computed tomography trajectories: Reconstruction from limited number of projections with DIRECTT
Lettre À M. Le Rédacteur En Chef Du Journal Des Économistes sur les comptes-rendus par MM. H. Passy et Courcelle-Seneuil
Sull'orginwe della Economia Sociale ovvero teoria della storia di questa scienza. Memoria del Prof. Giovanni
Brittle Materials in Mechanical Extremes
Micro Non-Destructive Testing and Evaluation
Micro Non-Destructive Testing and Evaluation
Extending synchrotron X-ray refraction techniques to the quantitative analysis of metallic materials
Advanced Characterization and On-Line Process Monitoring of Additively Manufactured Materials and Components
Visualization of stepwise electrode decomposition in a nail penetrated commercial lithium-ion cell using low-temperature synchrotron X-ray computed tomography
3D shape analysis of powder for laser beam melting by synchrotron X-ray CT
Noise and blur removal from corrupted X-ray computed tomography scans: A multilevel and multiscale deep convolutional framework approach with synthetic training data (BAM SynthCOND)
Suppression of Cone-Beam Artefacts with Direct Iterative Reconstruction Computed Tomography Trajectories (DIRECTT)
Direct iterative reconstruction of computed tomography trajectories: Reconstruction from limited number of projections with DIRECTT
Lettre À M. Le Rédacteur En Chef Du Journal Des Économistes sur les comptes-rendus par MM. H. Passy et Courcelle-Seneuil
Sull'orginwe della Economia Sociale ovvero teoria della storia di questa scienza. Memoria del Prof. Giovanni
Brittle Materials in Mechanical Extremes
Micro Non-Destructive Testing and Evaluation
Micro Non-Destructive Testing and Evaluation
Extending synchrotron X-ray refraction techniques to the quantitative analysis of metallic materials
Advanced Characterization and On-Line Process Monitoring of Additively Manufactured Materials and Components
Visualization of stepwise electrode decomposition in a nail penetrated commercial lithium-ion cell using low-temperature synchrotron X-ray computed tomography
3D shape analysis of powder for laser beam melting by synchrotron X-ray CT
Noise and blur removal from corrupted X-ray computed tomography scans: A multilevel and multiscale deep convolutional framework approach with synthetic training data (BAM SynthCOND)
Suppression of Cone-Beam Artefacts with Direct Iterative Reconstruction Computed Tomography Trajectories (DIRECTT)