E2E-BPF microscope: extended depth-of-field microscopy using learning-based implementation of binary phase filter and image deconvolution
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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E2E-BPF microscope: extended depth-of-field microscopy using learning-based implementation of binary phase filter and image deconvolution ; volume:12 ; number:1 ; day:13 ; month:11 ; year:2023 ; pages:1-14 ; date:12.2023
Light ; 12, Heft 1 (13.11.2023), 1-14, 12.2023
- Creator
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Seong, Baekcheon
Kim, Woovin
Kim, Younghun
Hyun, Kyung-A
Jung, Hyo-Il
Lee, Jong-Seok
Yoo, Jeonghoon
Joo, Chulmin
- Contributor
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SpringerLink (Online service)
- DOI
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10.1038/s41377-023-01300-5
- URN
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urn:nbn:de:101:1-2024013013481818760823
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:35 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Seong, Baekcheon
- Kim, Woovin
- Kim, Younghun
- Hyun, Kyung-A
- Jung, Hyo-Il
- Lee, Jong-Seok
- Yoo, Jeonghoon
- Joo, Chulmin
- SpringerLink (Online service)