DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2520-8128
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images ; volume:5 ; number:2 ; day:24 ; month:5 ; year:2022 ; pages:101-111 ; date:6.2022
Nanomanufacturing and metrology ; 5, Heft 2 (24.5.2022), 101-111, 6.2022
- Creator
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Du, Hongchu
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s41871-022-00137-7
- URN
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urn:nbn:de:101:1-2022081920493030501202
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:21 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Du, Hongchu
- SpringerLink (Online service)
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