Use of Electron Beam-Induced Current Technique to Characterize Transport Properties of Narrow-Gap-Energy Materials for IR Detection
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Use of Electron Beam-Induced Current Technique to Characterize Transport Properties of Narrow-Gap-Energy Materials for IR Detection ; volume:53 ; number:10 ; day:10 ; month:7 ; year:2024 ; pages:5850-5857 ; date:10.2024
Journal of electronic materials ; 53, Heft 10 (10.7.2024), 5850-5857, 10.2024
- Classification
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Physik
- Creator
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Bustillos Vasco, Samantha
Baier, Nicolas
Lobre, Clément
Cervera, Cyril
Péré-Laperne, Nicolas
Evirgen, Axel
Gravrand, Olivier
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s11664-024-11307-2
- URN
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urn:nbn:de:101:1-2411261303126.166702260081
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:39 AM CEST
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Associated
- Bustillos Vasco, Samantha
- Baier, Nicolas
- Lobre, Clément
- Cervera, Cyril
- Péré-Laperne, Nicolas
- Evirgen, Axel
- Gravrand, Olivier
- SpringerLink (Online service)
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