Digital Twin‐Assisted Degradation Diagnosis and Quantification of NMC Battery Aging Effects During Fast Charging

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Digital Twin‐Assisted Degradation Diagnosis and Quantification of NMC Battery Aging Effects During Fast Charging ; day:27 ; month:06 ; year:2024 ; extent:16
Advanced energy materials ; (27.06.2024) (gesamt 16)

Creator
Guo, Wendi
Sun, Zhongchao
Guo, Jia
Li, Yaqi
Vilsen, Søren Byg
Stroe, Daniel Ioan

DOI
10.1002/aenm.202401644
URN
urn:nbn:de:101:1-2406281404090.777161493385
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:51 AM CEST

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Associated

  • Guo, Wendi
  • Sun, Zhongchao
  • Guo, Jia
  • Li, Yaqi
  • Vilsen, Søren Byg
  • Stroe, Daniel Ioan

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