Digital Twin‐Assisted Degradation Diagnosis and Quantification of NMC Battery Aging Effects During Fast Charging
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Digital Twin‐Assisted Degradation Diagnosis and Quantification of NMC Battery Aging Effects During Fast Charging ; day:27 ; month:06 ; year:2024 ; extent:16
Advanced energy materials ; (27.06.2024) (gesamt 16)
- Creator
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Guo, Wendi
Sun, Zhongchao
Guo, Jia
Li, Yaqi
Vilsen, Søren Byg
Stroe, Daniel Ioan
- DOI
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10.1002/aenm.202401644
- URN
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urn:nbn:de:101:1-2406281404090.777161493385
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:51 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Guo, Wendi
- Sun, Zhongchao
- Guo, Jia
- Li, Yaqi
- Vilsen, Søren Byg
- Stroe, Daniel Ioan