Modeling of bias-induced changes of organic field-effect transistor characteristics
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Classification
-
Elektrotechnik, Elektronik
- Event
-
Veröffentlichung
- (where)
-
Augsburg
- (who)
-
Universität Augsburg
- (when)
-
2011
- Event
-
Veröffentlichung
- (where)
-
Eindhoven
- (who)
-
Technische Universiteit Eindhoven
- (when)
-
2011
- Creator
- DOI
-
10.6100/IR712654
- URN
-
urn:nbn:de:bvb:384-opus4-1039584
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:27 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Sharma, Abhinav
- Universität Augsburg
- Technische Universiteit Eindhoven
Time of origin
- 2011
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