Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1556-276X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide ; volume:6 ; number:1 ; day:18 ; month:3 ; year:2011 ; pages:1-5 ; date:12.2011
Nanoscale research letters ; 6, Heft 1 (18.3.2011), 1-5, 12.2011
- Creator
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Ahn, Jung-Joon
Jo, Yeong-Deuk
Kim, Sang-Cheol
Lee, Ji-Hoon
Koo, Sang-Mo
- Contributor
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SpringerLink (Online service)
- DOI
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10.1186/1556-276X-6-235
- URN
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urn:nbn:de:101:1-2019062300574457810135
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:59 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Ahn, Jung-Joon
- Jo, Yeong-Deuk
- Kim, Sang-Cheol
- Lee, Ji-Hoon
- Koo, Sang-Mo
- SpringerLink (Online service)
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