- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
-
Structural, electronic, and optical-absorption properties of 2D Si thin films ; volume:14 ; number:6 ; day:15 ; month:10 ; year:2024 ; pages:1273-1280 ; date:12.2024
MRS communications / Materials Research Society ; 14, Heft 6 (15.10.2024), 1273-1280, 12.2024
- Classification
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Ingenieurwissenschaften und Maschinenbau
- Creator
- Contributor
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SpringerLink (Online service)
- DOI
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10.1557/s43579-024-00657-x
- URN
-
urn:nbn:de:101:1-2502182106362.305136427241
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:32 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Saunders, Nicholas
- Palchoudhury, Soubantika
- Jakowski, Jacek
- Huang, Jingsong
- SpringerLink (Online service)
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