Structural, electronic, and optical-absorption properties of 2D Si thin films
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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1 Online-Ressource.
- Sprache
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Englisch
- Erschienen in
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Structural, electronic, and optical-absorption properties of 2D Si thin films ; volume:14 ; number:6 ; day:15 ; month:10 ; year:2024 ; pages:1273-1280 ; date:12.2024
MRS communications / Materials Research Society ; 14, Heft 6 (15.10.2024), 1273-1280, 12.2024
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- Urheber
- Beteiligte Personen und Organisationen
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SpringerLink (Online service)
- DOI
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10.1557/s43579-024-00657-x
- URN
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urn:nbn:de:101:1-2502182106362.305136427241
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:32 MESZ
Datenpartner
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Beteiligte
- Saunders, Nicholas
- Palchoudhury, Soubantika
- Jakowski, Jacek
- Huang, Jingsong
- SpringerLink (Online service)
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