Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High‐Voltage NMC811||SiO x ‐Containing Cells via Operando ATR‐FTIR Spectroscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High‐Voltage NMC811||SiO x ‐Containing Cells via Operando ATR‐FTIR Spectroscopy ; day:06 ; month:12 ; year:2023 ; extent:15
Advanced energy materials ; (06.12.2023) (gesamt 15)
- Creator
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Weiling, Matthias
Lechtenfeld, Christian
Pfeiffer, Felix
Frankenstein, Lars
Diddens, Diddo
Wang, Jian‐Fen
Nowak, Sascha
Baghernejad, Masoud
- DOI
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10.1002/aenm.202303568
- URN
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urn:nbn:de:101:1-2023120714094253805370
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:25 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Weiling, Matthias
- Lechtenfeld, Christian
- Pfeiffer, Felix
- Frankenstein, Lars
- Diddens, Diddo
- Wang, Jian‐Fen
- Nowak, Sascha
- Baghernejad, Masoud