Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High‐Voltage NMC811||SiO x ‐Containing Cells via Operando ATR‐FTIR Spectroscopy

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High‐Voltage NMC811||SiO x ‐Containing Cells via Operando ATR‐FTIR Spectroscopy ; day:06 ; month:12 ; year:2023 ; extent:15
Advanced energy materials ; (06.12.2023) (gesamt 15)

Creator
Weiling, Matthias
Lechtenfeld, Christian
Pfeiffer, Felix
Frankenstein, Lars
Diddens, Diddo
Wang, Jian‐Fen
Nowak, Sascha
Baghernejad, Masoud

DOI
10.1002/aenm.202303568
URN
urn:nbn:de:101:1-2023120714094253805370
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:25 AM CEST

Data provider

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Associated

  • Weiling, Matthias
  • Lechtenfeld, Christian
  • Pfeiffer, Felix
  • Frankenstein, Lars
  • Diddens, Diddo
  • Wang, Jian‐Fen
  • Nowak, Sascha
  • Baghernejad, Masoud

Other Objects (12)