X-ray diffraction by disordered lamellar structures : theory and applications to microdivided silicates and carbons

zu Verbundenen Objekten

Standort: Deutsche Nationalbibliothek Frankfurt am Main

ISBN: 9783540512226
3540512225
9780387512228
0387512225

Maße: 24 cm

Umfang: XVII, 371 S.

Sprache: Deutsch

Anmerkungen: Ill., graph. Darst.
Literaturangaben

Schlagwort: Mikrokristall
Schichtgitter
Gitterbaufehler
Röntgenstrukturanalyse

Ereignis: Veröffentlichung

(wo): Berlin, Heidelberg, New York, London, Paris, Tokyo, Hong Kong, Barcelona

(wer): Springer

(wann): 1990

Urheber: Dric, Viktor A.
Tchoubar, Cyril

Inhaltsverzeichnis: https://d-nb.info/900672595/04

Rechteinformation: Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.

Letzte Aktualisierung: 11.06.2025, 13:51 MESZ

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Beteiligte

Dric, Viktor A.
Tchoubar, Cyril
Springer

Entstanden

1990

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X-ray diffraction by disordered lamellar structures : theory and applications to microdivided silicates and carbons

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