Hochschulschrift
RT-Level power-gating models optimizing dynamic leakage-management
- Alternative title
-
Power-Gating Modelle auf RT-Ebene zur Optimierung des dynamischen Leckstrom-Managements
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Oldenburg, Universität Oldenburg, Diss., 2012
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Verluststrom ; Transistor ; CMOS
- Event
-
Veröffentlichung
- (where)
-
Oldenburg
- (who)
-
IBIT - Universitätsbibliothek
- (when)
-
2012
- Creator
- Contributor
- URN
-
urn:nbn:de:gbv:715-oops-14731
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:45 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Rosinger, Sven
- Nebel, Wolfgang
- IBIT - Universitätsbibliothek
Time of origin
- 2012
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