Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2287-4445
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Advanced atomic force microscopy-based techniques for nanoscale characterization of switching devices for emerging neuromorphic applications ; volume:51 ; number:1 ; day:26 ; month:5 ; year:2021 ; pages:1-9 ; date:12.2021
Applied microscopy ; 51, Heft 1 (26.5.2021), 1-9, 12.2021
- Creator
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Kim, Young-Min
Lee, Jihye
Jeon, Deok-Jin
Oh, Si-Eun
Yeo, Jong-Souk
- Contributor
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SpringerLink (Online service)
- DOI
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10.1186/s42649-021-00056-9
- URN
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urn:nbn:de:101:1-2021092219212850600912
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:22 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kim, Young-Min
- Lee, Jihye
- Jeon, Deok-Jin
- Oh, Si-Eun
- Yeo, Jong-Souk
- SpringerLink (Online service)
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