- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1434-6052
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX ; volume:80 ; number:3 ; day:21 ; month:3 ; year:2020 ; pages:1-20 ; date:3.2020
The European physical journal / C. C, Particles and fields ; 80, Heft 3 (21.3.2020), 1-20, 3.2020
- Creator
-
Kravitz, S.
Smith, R. J.
Hagaman, L.
Bernard, E. P.
McKinsey, D. N.
Rudd, L.
Tvrznikova, L.
Gann, G. D. Orebi
Sakai, M.
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1140/epjc/s10052-020-7800-6
- URN
-
urn:nbn:de:101:1-2020072420022546203927
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:54 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kravitz, S.
- Smith, R. J.
- Hagaman, L.
- Bernard, E. P.
- McKinsey, D. N.
- Rudd, L.
- Tvrznikova, L.
- Gann, G. D. Orebi
- Sakai, M.
- SpringerLink (Online service)
Other Objects (12)
VUV transmission of PTFE for xenon-based particle detectors
Radon daughter removal from PTFE surfaces and its application in liquid xenon detectors
Angle resolved dielectric response in carbon nanotubes
Towards robust dichroism in angle-resolved photoemission
First time-resolved measurement of infrared scintillation light in gaseous xenon
Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
Employing Surface Curvature for Spatially Resolved X‐Ray Reflectivity: Graphene Domains on Liquid Copper
TGL 21443/01, Plaste - Polytetraflouräthylen (PTFE) - PTFE-Pulver
Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity
Klebemöglichkeiten von PTFE
Sub-ppb xenon purity control and study of PTFE surface contamination towards the first results of XENONnT
Xenon
VUV transmission of PTFE for xenon-based particle detectors
Radon daughter removal from PTFE surfaces and its application in liquid xenon detectors
Angle resolved dielectric response in carbon nanotubes
Towards robust dichroism in angle-resolved photoemission
First time-resolved measurement of infrared scintillation light in gaseous xenon
Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
Employing Surface Curvature for Spatially Resolved X‐Ray Reflectivity: Graphene Domains on Liquid Copper
TGL 21443/01, Plaste - Polytetraflouräthylen (PTFE) - PTFE-Pulver
Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity
Klebemöglichkeiten von PTFE
Sub-ppb xenon purity control and study of PTFE surface contamination towards the first results of XENONnT
Xenon
VUV transmission of PTFE for xenon-based particle detectors
Radon daughter removal from PTFE surfaces and its application in liquid xenon detectors
Angle resolved dielectric response in carbon nanotubes
Towards robust dichroism in angle-resolved photoemission
First time-resolved measurement of infrared scintillation light in gaseous xenon
Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
Employing Surface Curvature for Spatially Resolved X‐Ray Reflectivity: Graphene Domains on Liquid Copper
TGL 21443/01, Plaste - Polytetraflouräthylen (PTFE) - PTFE-Pulver
Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity
Klebemöglichkeiten von PTFE
Sub-ppb xenon purity control and study of PTFE surface contamination towards the first results of XENONnT