Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2198-0926
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope ; volume:4 ; number:1 ; day:24 ; month:8 ; year:2018 ; pages:1-10 ; date:12.2018
Advanced structural and chemical imaging ; 4, Heft 1 (24.8.2018), 1-10, 12.2018
- Creator
- Contributor
-
Idrobo, Juan Carlos
Chi, Miaofang
SpringerLink (Online service)
- DOI
-
10.1186/s40679-018-0059-4
- URN
-
urn:nbn:de:101:1-2018101901374856514281
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:34 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Hachtel, Jordan A.
- Idrobo, Juan Carlos
- Chi, Miaofang
- SpringerLink (Online service)
Other Objects (12)
The scanning transmission X-ray microscope at BESSY II
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Ultrastructure of human spleen in transmission and scanning electron microscope
Nanoscale electric field imaging with an ambient scanning quantum sensor microscope
SPM: Scanning positron microscope
A scanning cavity microscope
Quantifying local structure and chemistry with the scanning transmission electron microscope
Direct imaging of electron density with a scanning transmission electron microscope
Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope
Transmission diffraction in a scanning electron microscope with pixelated detectors: Development and applications
Scanning capacitance microscope imaging and modelling
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope
The scanning transmission X-ray microscope at BESSY II
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Ultrastructure of human spleen in transmission and scanning electron microscope
Nanoscale electric field imaging with an ambient scanning quantum sensor microscope
SPM: Scanning positron microscope
A scanning cavity microscope
Quantifying local structure and chemistry with the scanning transmission electron microscope
Direct imaging of electron density with a scanning transmission electron microscope
Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope
Transmission diffraction in a scanning electron microscope with pixelated detectors: Development and applications
Scanning capacitance microscope imaging and modelling
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope
The scanning transmission X-ray microscope at BESSY II
Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector
Ultrastructure of human spleen in transmission and scanning electron microscope
Nanoscale electric field imaging with an ambient scanning quantum sensor microscope
SPM: Scanning positron microscope
A scanning cavity microscope
Quantifying local structure and chemistry with the scanning transmission electron microscope
Direct imaging of electron density with a scanning transmission electron microscope
Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope
Transmission diffraction in a scanning electron microscope with pixelated detectors: Development and applications
Scanning capacitance microscope imaging and modelling