Hochschulschrift
Internal laser probing techniques for power devices : analysis, modeling, and simulation
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
30 cm
- Umfang
-
XII, 175 S.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
München, Techn. Univ., Diss., 2000
- Schlagwort
-
Leistungshalbleiter
Temperaturverteilung
Ladungsträger
Dichte
Brechungsindexprofil
Lasermesstechnik
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:06 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
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