Low‐Temperature Saw Damage Gettering to Improve Minority Carrier Lifetime in Multicrystalline Silicon
The minority carrier lifetime in multicrystalline silicon − a material used in the majority of today's manufactured solar cells − is limited by defects within the material, including metallic impurities which are relatively mobile at low temperatures (≤700 °C). Addition of an optimised thermal process which can facilitate impurity diffusion to the saw damage at the wafer surfaces can result in permanent removal of the impurities when the saw damage is etched away. We demonstrate that this saw damage gettering is effective at 500 to 700 °C and, when combined with subsequent low‐temperature processing, lifetimes are improved by a factor of more than four relative to the as‐grown state. The simple method has the potential to be a low thermal budget process for the improvement of low‐lifetime “red zone” wafers.
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Low‐Temperature Saw Damage Gettering to Improve Minority Carrier Lifetime in Multicrystalline Silicon ; volume:11 ; number:10 ; year:2017 ; extent:4
Physica status solidi / Rapid research letters. Rapid research letters ; 11, Heft 10 (2017) (gesamt 4)
- Creator
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Al‐Amin, M.
Grant, N. E.
Murphy, J. D.
- DOI
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10.1002/pssr.201700268
- URN
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urn:nbn:de:101:1-2022093008105037084865
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:23 AM CEST
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Associated
- Al‐Amin, M.
- Grant, N. E.
- Murphy, J. D.
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Device architecture and lifetime requirements for high efficiency multicrystalline silicon solar cells
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Investigation of low-temperature cofired ceramics packages for high-temperature SAW sensors
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saw duang (saw duēng)
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Influence of saw damage etching on the mechanical stability of multi-crystalline wafers
Understanding the Light-induced Lifetime Degradation and Regeneration in Multicrystalline Silicon
Influence of low-temperature annealing before firing on LeTID in multicrystalline silicon
Device architecture and lifetime requirements for high efficiency multicrystalline silicon solar cells
Predicting solar cell efficiencies from bulk lifetime images of multicrystalline silicon bricks
Lifetime degradation and regeneration in multicrystalline silicon under illumination at elevated temperature
Investigation of low-temperature cofired ceramics packages for high-temperature SAW sensors
Light and elevated Temperature Induced Degradation (LeTID) of the carrier lifetime in multicrystalline silicon
Extraordinarily High Minority Charge Carrier Lifetime Observed in Crystalline Silicon
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