Novel High Holding Voltage SCR with Embedded Carrier Recombination Structure for Latch-up Immune and Robust ESD Protection

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Novel High Holding Voltage SCR with Embedded Carrier Recombination Structure for Latch-up Immune and Robust ESD Protection ; volume:14 ; number:1 ; day:28 ; month:5 ; year:2019 ; pages:1-7 ; date:12.2019
Nanoscale research letters ; 14, Heft 1 (28.5.2019), 1-7, 12.2019

Creator
Wang, Zhuo
Qi, Zhao
Liang, Longfei
Qiao, Ming
Li, Zhaoji
Zhang, Bo
Contributor
SpringerLink (Online service)

DOI
10.1186/s11671-019-3017-8
URN
urn:nbn:de:101:1-2019112310574202145506
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:46 AM CEST

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Associated

  • Wang, Zhuo
  • Qi, Zhao
  • Liang, Longfei
  • Qiao, Ming
  • Li, Zhaoji
  • Zhang, Bo
  • SpringerLink (Online service)

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