Carry Your Fault: A Fault Propagation Attack on Side-Channel Protected LWE-based KEM
Abstract: Post-quantum cryptographic (PQC) algorithms, especially those based on the learning with errors (LWE) problem, have been subjected to several physical attacks in the recent past. Although the attacks broadly belong to two classes – passive side-channel attacks and active fault attacks, the attack strategies vary significantly due to the inherent complexities of such algorithms. Exploring further attack surfaces is, therefore, an important step for eventually securing the deployment of these algorithms. Also, it is mportant to test the robustness of the already proposed countermeasures in this regard. In this work, we propose a new fault attack on side-channel secure masked implementation of LWE-based key-encapsulation mechanisms (KEMs) exploiting fault propagation. The attack typically originates due to an algorithmic modification widely used to enable masking, namely the Arithmetic-to-Boolean (A2B) conversion. We exploit the data dependency of the adder carry chain in A2B and extr.... https://tches.iacr.org/index.php/TCHES/article/view/11449
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Carry Your Fault: A Fault Propagation Attack on Side-Channel Protected LWE-based KEM ; volume:2024 ; number:2 ; year:2024
IACR transactions on cryptographic hardware and embedded systems ; 2024, Heft 2 (2024)
- Creator
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Kundu, Suparna
Chowdhury, Siddhartha
Saha, Sayandeep
Karmakar, Angshuman
Mukhopadhyay, Debdeep
Verbauwhede, Ingrid
- DOI
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10.46586/tches.v2024.i2.844-869
- URN
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urn:nbn:de:101:1-2024032017565571002863
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:44 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kundu, Suparna
- Chowdhury, Siddhartha
- Saha, Sayandeep
- Karmakar, Angshuman
- Mukhopadhyay, Debdeep
- Verbauwhede, Ingrid
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Implementation of three efficient 4-digit fault-tolerant quantum carry lookahead adders
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Fault detection and fault-tolerant control for nonlinear systems
Advanced methods for fault diagnosis and fault-tolerant control
Probabilistic Fault Displacement Hazard Analysis for North Tabriz Fault
Deep Fault Drilling Project – Alpine Fault, New Zealand
Augurs at fault
Side-Channel and Fault Attacks in Modern Lattice-Based Cryptography
Fault diagnosis systems : an introduction from fault detection to fault tolerance
Analysis and Mitigation of Remote Side-Channel and Fault Attacks on the Electrical Level
Implementation of three efficient 4-digit fault-tolerant quantum carry lookahead adders
Fault Injection as an Oscilloscope: Fault Correlation Analysis
Fault roughness and fault complexity : field study, multi-scale analysis and numerical fault model
Fault roughness and fault complexity : field study, multi-scale analysis and numerical fault model
Fault detection and fault-tolerant control for nonlinear systems
Advanced methods for fault diagnosis and fault-tolerant control
Probabilistic Fault Displacement Hazard Analysis for North Tabriz Fault
Deep Fault Drilling Project – Alpine Fault, New Zealand