High-temperature sensitivity complex dielectric/electric modulus, loss tangent, and AC conductivity in Au/(S:DLC)/p-Si (MIS) structures

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: 1 Online-Ressource.

Language: Englisch

Bibliographic citation: High-temperature sensitivity complex dielectric/electric modulus, loss tangent, and AC conductivity in Au/(S:DLC)/p-Si (MIS) structures ; volume:35 ; number:3 ; day:25 ; month:1 ; year:2024 ; pages:1-11 ; date:1.2024
Journal of materials science / Materials in electronics ; 35, Heft 3 (25.1.2024), 1-11, 1.2024

Classification: Ingenieurwissenschaften und Maschinenbau

Creator: Tataroglu, A.
Durmuş, H.
Vahid, A. Feizollahi
Avar, B.
Altındal, Ş

Contributor: SpringerLink (Online service)

DOI: 10.1007/s10854-024-12007-7

URN: urn:nbn:de:101:1-2404180715369.353553216552

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 10:55 AM CEST

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Tataroglu, A.
Durmuş, H.
Vahid, A. Feizollahi
Avar, B.
Altındal, Ş
SpringerLink (Online service)

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High-temperature sensitivity complex dielectric/electric modulus, loss tangent, and AC conductivity in Au/(S:DLC)/p-Si (MIS) structures

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