Simulation Study of the Double-Gate Tunnel Field-Effect Transistor with Step Channel Thickness

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Simulation Study of the Double-Gate Tunnel Field-Effect Transistor with Step Channel Thickness ; volume:15 ; number:1 ; day:15 ; month:6 ; year:2020 ; pages:1-9 ; date:12.2020
Nanoscale research letters ; 15, Heft 1 (15.6.2020), 1-9, 12.2020

Classification
Wirtschaft

Creator
Zhang, Maolin
Guo, Yufeng
Zhang, Jun
Yao, Jiafei
Chen, Jing
Contributor
SpringerLink (Online service)

DOI
10.1186/s11671-020-03360-7
URN
urn:nbn:de:101:1-2020081222144587453979
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 11:01 AM CEST

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Associated

  • Zhang, Maolin
  • Guo, Yufeng
  • Zhang, Jun
  • Yao, Jiafei
  • Chen, Jing
  • SpringerLink (Online service)

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