Correlative Analysis of Surfaces and Nanostructures to Understand their Physics Using AFM and SEM
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
München, Hochschule für angewandte Wissenschaften München, Masterarbeit, 2024
- Keyword
-
Elektronenmikroskopie
Nanostruktur
Rasterkraftmikroskopie
Nanomechanik
- Event
-
Veröffentlichung
- (where)
-
München
- (who)
-
Hochschule für angewandte Wissenschaften München
- (when)
-
2024
- Creator
-
Jangid, Darshit
- Contributor
-
Eulenkamp, Constanze
Khanh, Pham-Gia
Plank, Harald
Schwalb, Christian
Quantum Design Microscopy GmbH
- URN
-
urn:nbn:de:bvb:m347-opus-4893
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:52 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Jangid, Darshit
- Eulenkamp, Constanze
- Khanh, Pham-Gia
- Plank, Harald
- Schwalb, Christian
- Quantum Design Microscopy GmbH
- Hochschule für angewandte Wissenschaften München
Time of origin
- 2024
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