Influencing parameters on image quality using photon counting detectors for laminography
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: 7th European-American Workshop on Reliability of NDE, Potsdam, Germany, 05.09.2017
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
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Bundesanstalt für Materialforschung und -prüfung (BAM)
- (wann)
-
2017
- Urheber
-
Schumacher, David
Ewert, Uwe
Zscherpel, Uwe
- URN
-
urn:nbn:de:kobv:b43-428912
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:46 MEZ
Datenpartner
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Beteiligte
- Schumacher, David
- Ewert, Uwe
- Zscherpel, Uwe
- Bundesanstalt für Materialforschung und -prüfung (BAM)
Entstanden
- 2017
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