Electronic Characteristics of Ultra‐Thin Passivation Layers for Silicon Photovoltaics
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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Electronic Characteristics of Ultra‐Thin Passivation Layers for Silicon Photovoltaics ; day:04 ; month:09 ; year:2022 ; extent:9
Advanced materials interfaces ; (04.09.2022) (gesamt 9)
- Urheber
-
Pain, Sophie L.
Khorani, Edris
Niewelt, Tim
Wratten, Ailish
Paez Fajardo, Galo J.
Winfield, Ben P.
Bonilla, Ruy S.
Walker, Marc
Piper, Louis F. J.
Grant, Nicholas E.
Murphy, John D.
- DOI
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10.1002/admi.202201339
- URN
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urn:nbn:de:101:1-2022090515054528707981
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
- 15.08.2025, 07:28 MESZ
Datenpartner
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Beteiligte
- Pain, Sophie L.
- Khorani, Edris
- Niewelt, Tim
- Wratten, Ailish
- Paez Fajardo, Galo J.
- Winfield, Ben P.
- Bonilla, Ruy S.
- Walker, Marc
- Piper, Louis F. J.
- Grant, Nicholas E.
- Murphy, John D.
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