Detecting defects that reduce breakdown voltage using machine learning and optical profilometry
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Detecting defects that reduce breakdown voltage using machine learning and optical profilometry ; volume:14 ; number:1 ; day:28 ; month:3 ; year:2024 ; pages:1-9 ; date:12.2024
Scientific reports ; 14, Heft 1 (28.3.2024), 1-9, 12.2024
- Classification
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Elektrotechnik, Elektronik
- Creator
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Gallagher, James C.
Mastro, Michael A.
Jacobs, Alan G.
Kaplar, Robert. J.
Hobart, Karl D.
Anderson, Travis J.
- Contributor
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SpringerLink (Online service)
- DOI
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10.1038/s41598-024-57875-5
- URN
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urn:nbn:de:101:1-2406122113495.864026080105
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:46 AM CEST
Data provider
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Associated
- Gallagher, James C.
- Mastro, Michael A.
- Jacobs, Alan G.
- Kaplar, Robert. J.
- Hobart, Karl D.
- Anderson, Travis J.
- SpringerLink (Online service)
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