Detecting defects that reduce breakdown voltage using machine learning and optical profilometry

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
1 Online-Ressource.
Language
Englisch

Bibliographic citation
Detecting defects that reduce breakdown voltage using machine learning and optical profilometry ; volume:14 ; number:1 ; day:28 ; month:3 ; year:2024 ; pages:1-9 ; date:12.2024
Scientific reports ; 14, Heft 1 (28.3.2024), 1-9, 12.2024

Classification
Elektrotechnik, Elektronik

Creator
Gallagher, James C.
Mastro, Michael A.
Jacobs, Alan G.
Kaplar, Robert. J.
Hobart, Karl D.
Anderson, Travis J.
Contributor
SpringerLink (Online service)

DOI
10.1038/s41598-024-57875-5
URN
urn:nbn:de:101:1-2406122113495.864026080105
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:46 AM CEST

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Associated

  • Gallagher, James C.
  • Mastro, Michael A.
  • Jacobs, Alan G.
  • Kaplar, Robert. J.
  • Hobart, Karl D.
  • Anderson, Travis J.
  • SpringerLink (Online service)

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