Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Semiconductor Science and Technology (35:5) - Bristol : IOP - Art.-Id. 054001
- Event
-
Veröffentlichung
- (where)
-
Berlin
- (who)
-
Technische Universität Berlin
- (when)
-
2022
- Creator
-
Trager-Cowan, Carol
Alasmari, A.
Avis, W.
Bruckbauer, Jochen
Edwards, Paul R.
Ferenczi, G.
Hourahine, B.
Kotzai, A.
Kraeusel, S.
Kusch, G.
Martin, Robert W.
McDermott, R.
Naresh-Kumar, G.
Nouf-Allehiani, M.
Pascal, E.
Thomson, D.
Vespucci, S.
Smith, M. D.
Parbrook, Peter J.
Enslin, Johannes
Mehnke, F.
Kuhn, Christian
Wernicke, Tim
Kneissl, Michael
Hagedorn, S.
Knauer, A.
Walde, S.
Weyers, M.
Coulon, P.-M.
Shields, Philip A.
Bai, J.
Gong, Y.
Jiu, Ling
Zhang, Y.
Smith, R. M.
Wang, T.
Winkelmann, A.
- DOI
-
10.14279/depositonce-15152
- Handle
-
11303/16376
- URN
-
urn:nbn:de:101:1-2022021601043645916262
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:30 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Trager-Cowan, Carol
- Alasmari, A.
- Avis, W.
- Bruckbauer, Jochen
- Edwards, Paul R.
- Ferenczi, G.
- Hourahine, B.
- Kotzai, A.
- Kraeusel, S.
- Kusch, G.
- Martin, Robert W.
- McDermott, R.
- Naresh-Kumar, G.
- Nouf-Allehiani, M.
- Pascal, E.
- Thomson, D.
- Vespucci, S.
- Smith, M. D.
- Parbrook, Peter J.
- Enslin, Johannes
- Mehnke, F.
- Kuhn, Christian
- Wernicke, Tim
- Kneissl, Michael
- Hagedorn, S.
- Knauer, A.
- Walde, S.
- Weyers, M.
- Coulon, P.-M.
- Shields, Philip A.
- Bai, J.
- Gong, Y.
- Jiu, Ling
- Zhang, Y.
- Smith, R. M.
- Wang, T.
- Winkelmann, A.
- Technische Universität Berlin
Time of origin
- 2022
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