Intrinsic AC Dielectric Breakdown Strength of Polyimide Films at the Extreme: New Breakthrough Insights on Thickness Dependence
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
-
Intrinsic AC Dielectric Breakdown Strength of Polyimide Films at the Extreme: New Breakthrough Insights on Thickness Dependence ; day:19 ; month:12 ; year:2023 ; extent:13
Advanced materials interfaces ; (19.12.2023) (gesamt 13)
- Creator
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Diaham, Sombel
Lambkin, Paul
O'Sullivan, Lawrence
Chen, Baoxing
- DOI
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10.1002/admi.202300822
- URN
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urn:nbn:de:101:1-2023121914241065056431
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:24 AM CEST
Data provider
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Associated
- Diaham, Sombel
- Lambkin, Paul
- O'Sullivan, Lawrence
- Chen, Baoxing
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