- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783896493064
389649306X
- Dimensions
-
21 cm
- Extent
-
X, 137 S.
- Edition
-
1. Aufl.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Zugl.: Zürich, Eidgenössische Techn. Hochsch., Diss., 1998
- Bibliographic citation
-
Series in microelectronics ; Vol. 74
- Keyword
-
CMOS
Zuverlässigkeit
Elektromigration
Metallisieren
Mikrostruktur
Oberflächenanalyse
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
Hartung-Gorre
- (when)
-
1998
- Creator
-
Schönbächler, Edgar Arthur
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 12:28 PM CET
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Schönbächler, Edgar Arthur
- Hartung-Gorre
Time of origin
- 1998
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