Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Analysis of CeO2/SiO2 double-layer thin film stack with antireflection effect for silicon solar cells ; volume:35 ; number:22 ; day:31 ; month:7 ; year:2024 ; pages:1-9 ; date:8.2024
Journal of materials science / Materials in electronics ; 35, Heft 22 (31.7.2024), 1-9, 8.2024
- Creator
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Kanmaz, Imran
Tomakin, Murat
Uzum, Abdullah
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s10854-024-13245-5
- URN
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urn:nbn:de:101:1-2411110941004.408285680553
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:35 AM CEST
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Associated
- Kanmaz, Imran
- Tomakin, Murat
- Uzum, Abdullah
- SpringerLink (Online service)
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