Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures : MAD and DAFS for studying Semiconductor Nanostructures
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1951-6401
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Multiwavelength anomalous diffraction and diffraction anomalous fine structure to study composition and strain of semiconductor nanostructures ; volume:208 ; number:1 ; day:15 ; month:6 ; year:2012 ; pages:189-216 ; date:6.2012
European physical journal special topics ; 208, Heft 1 (15.6.2012), 189-216, 6.2012
- Creator
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Favre-Nicolin, V.
Proietti, M. G.
Leclere, C.
Katcho, N. A.
Richard, M. -I
Renevier, H.
- Contributor
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SpringerLink (Online service)
- DOI
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10.1140/epjst/e2012-01619-x
- URN
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urn:nbn:de:101:1-2019091914074940514267
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:20 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Favre-Nicolin, V.
- Proietti, M. G.
- Leclere, C.
- Katcho, N. A.
- Richard, M. -I
- Renevier, H.
- SpringerLink (Online service)
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