- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices ; day:10 ; month:07 ; year:2021 ; extent:10
Advanced theory and simulations ; (10.07.2021) (gesamt 10)
- Urheber
-
Hofer, Vera
Nowak, Thomas
Lewitschnig, Horst
- DOI
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10.1002/adts.202100092
- URN
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urn:nbn:de:101:1-2021071015261203215648
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:50 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Hofer, Vera
- Nowak, Thomas
- Lewitschnig, Horst
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