- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
Spline‐Based Drift Analysis for the Reliability of Semiconductor Devices ; day:10 ; month:07 ; year:2021 ; extent:10
Advanced theory and simulations ; (10.07.2021) (gesamt 10)
- Creator
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Hofer, Vera
Nowak, Thomas
Lewitschnig, Horst
- DOI
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10.1002/adts.202100092
- URN
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urn:nbn:de:101:1-2021071015261203215648
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:50 AM CEST
Data provider
This object is provided by:
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Associated
- Hofer, Vera
- Nowak, Thomas
- Lewitschnig, Horst
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