Increasing throughput of AFM-based single cell adhesion measurements through multisubstrate surfaces
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Bibliographic citation
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Increasing throughput of AFM-based single cell adhesion measurements through multisubstrate surfaces ; volume:6 ; pages:157-166
Beilstein journal of nanotechnology ; 6, 157-166
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.6.15
- URN
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urn:nbn:de:101:1-2015030517504
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:23 AM CEST
Data provider
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