Electrical in‐situ characterisation of interface stabilised organic thin‐film transistors
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Electrical in‐situ characterisation of interface stabilised organic thin‐film transistors ; volume:9 ; number:7 ; year:2015 ; pages:420-424 ; extent:5
Physica status solidi / Rapid research letters. Rapid research letters ; 9, Heft 7 (2015), 420-424 (gesamt 5)
- Creator
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Striedinger, Bernd
Fian, Alexander
Petritz, Andreas
Lassnig, Roman
Winkler, Adolf
Stadlober, Barbara
- DOI
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10.1002/pssr.201510169
- URN
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urn:nbn:de:101:1-2022112406164054492788
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:37 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Striedinger, Bernd
- Fian, Alexander
- Petritz, Andreas
- Lassnig, Roman
- Winkler, Adolf
- Stadlober, Barbara
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