Development programs for one-shot systems using multiple-state design reliability models

Arbeitspapier

Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change.

Object Details

• Language: Englisch

References and Relationships

• Bibliographic citation: Series: Technical Report ; No. 2003,43

Classification and Topics

• Subject: development programs ; one-shot systems ; multiple-state design reliability ; test ; redesign ; optimal programs ; dynamic programming ; accelerated testing

Contributors, Places and Time

• Event: Geistige Schöpfung
• (who): Shevasuthislip, Suntichai ; Vardeman, Stephen B.
• Event: Veröffentlichung
• (who): Universität Dortmund, Sonderforschungsbereich 475 - Komplexitätsreduktion in Multivariaten Datenstrukturen
• (where): Dortmund
• (when): 2003

Further information

• Handle: http://hdl.handle.net/10419/49317
• Last update: 09.07.2025, 8:20 PM CEST