Hochschulschrift
Stress characterization and imaging of semiconductor nanostructures by far-field and near-field Raman spectroscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Dimensions
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21 cm
- Extent
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getr. Zählung
- Language
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Englisch
- Notes
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Ill., graph. Darst.
Dresden, Techn. Univ., Diss., 2012
- Creator
- Table of contents
- Rights
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Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
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11.06.2025, 2:28 PM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
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