Characterisation of irradiated thin silicon sensors for the CMS phase II pixel upgrade

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1434-6052
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Characterisation of irradiated thin silicon sensors for the CMS phase II pixel upgrade ; volume:77 ; number:8 ; day:22 ; month:8 ; year:2017 ; pages:1-13 ; date:8.2017
The European physical journal / C. C, Particles and fields ; 77, Heft 8 (22.8.2017), 1-13, 8.2017

Classification
Physik

Creator
Adam, W.
Contributor
SpringerLink (Online service)

DOI
10.1140/epjc/s10052-017-5115-z
URN
urn:nbn:de:1111-201801015908
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:38 AM CEST

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Associated

  • Adam, W.
  • SpringerLink (Online service)

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