Error masking in self-testable circuits

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Notes: In: Denburg, Donald (Hrsg.): The changing philosophy of test : proceedings. Piscataway, NJ : IEEE Computer Soc. Pr., 1990. - ISBN 0-8186-2064-1, S. 544-552. URL http://dx.doi.org./10.1109/TEST.1990.114066

Classification: Elektrotechnik, Elektronik

Keyword: Selbsttest ; Integrierte Schaltung ; Signaturanalyse

Event: Veröffentlichung

(where): Stuttgart

(who): Universitätsbibliothek der Universität Stuttgart

(when): 2012

Creator: Ströle, Albrecht P.
Wunderlich, Hans-Joachim

URN: urn:nbn:de:bsz:93-opus-73162

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.0011, 2:22 AM CET

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Ströle, Albrecht P.
Wunderlich, Hans-Joachim
Universitätsbibliothek der Universität Stuttgart

Time of origin

2012

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Coherent Ising Machines with Optical Error Correction Circuits

P05-06. Masking of MPER epitopes through self-associations

Masking tape ideeënboek

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Error masking in self-testable circuits

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Other Objects (12)

The Self-Appraisal of Masking Instrument

The Self-Appraisal of Masking Instrument

General error mitigation for quantum circuits

General error mitigation for quantum circuits

IPM-RED : combining higher-order masking with robust error detection

IPM-RED: combining higher-order masking with robust error detection

Automatic design error correction of combinational circuits

Physical optimization of quantum error correction circuits

Automated Design Error Debugging of Digital VLSI Circuits

Coherent Ising Machines with Optical Error Correction Circuits

P05-06. Masking of MPER epitopes through self-associations

Masking tape ideeënboek

The Self-Appraisal of Masking Instrument

The Self-Appraisal of Masking Instrument

General error mitigation for quantum circuits

General error mitigation for quantum circuits

IPM-RED : combining higher-order masking with robust error detection

IPM-RED: combining higher-order masking with robust error detection

Automatic design error correction of combinational circuits

Physical optimization of quantum error correction circuits

Automated Design Error Debugging of Digital VLSI Circuits

Coherent Ising Machines with Optical Error Correction Circuits

P05-06. Masking of MPER epitopes through self-associations

Masking tape ideeënboek

The Self-Appraisal of Masking Instrument

The Self-Appraisal of Masking Instrument

General error mitigation for quantum circuits

General error mitigation for quantum circuits

IPM-RED : combining higher-order masking with robust error detection

IPM-RED: combining higher-order masking with robust error detection

Automatic design error correction of combinational circuits

Physical optimization of quantum error correction circuits

Automated Design Error Debugging of Digital VLSI Circuits

Coherent Ising Machines with Optical Error Correction Circuits

P05-06. Masking of MPER epitopes through self-associations

Masking tape ideeënboek

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