- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783832500849
3832500847
- Dimensions
-
21 cm
- Extent
-
VI, 110 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Zugl.: Dresden, Techn. Univ., Diss., 2002
- Keyword
-
Silicium
Störstelle
Kupfer
Wasserstoff
DLTS
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 2:15 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Knack, Steffen
- Logos-Verl.
Time of origin
- 2002
Other Objects (12)
Influence of hydrogen on the regeneration of boron-oxygen related defects in crystalline silicon
Hydrogen passivation of extended defects in multicrystalline silicon solar cells
Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon
Hydrogen-related defects in ZnO and TiO2
Hydrogen-related defects in ZnO and TiO2
Optical spectroscopy on silicon vacancy defects in silicon carbide
Optical spectroscopy on silicon vacancy defects in silicon carbide
Boron-oxygen related defects in Cz-silicon solar cells degradation, regeneration and beyond
Lifetime-limiting defects in monocrystalline silicon
Lifetime-limiting defects in monocrystalline silicon
Engineering of Highly Coherent Silicon Vacancy Defects in Silicon Carbide
Silicon vacancy defects in 4H-silicon carbide semiconductor for quantum applications
Influence of hydrogen on the regeneration of boron-oxygen related defects in crystalline silicon
Hydrogen passivation of extended defects in multicrystalline silicon solar cells
Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon
Hydrogen-related defects in ZnO and TiO2
Hydrogen-related defects in ZnO and TiO2
Optical spectroscopy on silicon vacancy defects in silicon carbide
Optical spectroscopy on silicon vacancy defects in silicon carbide
Boron-oxygen related defects in Cz-silicon solar cells degradation, regeneration and beyond
Lifetime-limiting defects in monocrystalline silicon
Lifetime-limiting defects in monocrystalline silicon
Engineering of Highly Coherent Silicon Vacancy Defects in Silicon Carbide
Silicon vacancy defects in 4H-silicon carbide semiconductor for quantum applications
Influence of hydrogen on the regeneration of boron-oxygen related defects in crystalline silicon
Hydrogen passivation of extended defects in multicrystalline silicon solar cells
Influence of hydrogen effusion from hydrogenated silicon nitride layers on the regeneration of boron-oxygen related defects in crystalline silicon
Hydrogen-related defects in ZnO and TiO2
Hydrogen-related defects in ZnO and TiO2
Optical spectroscopy on silicon vacancy defects in silicon carbide
Optical spectroscopy on silicon vacancy defects in silicon carbide
Boron-oxygen related defects in Cz-silicon solar cells degradation, regeneration and beyond
Lifetime-limiting defects in monocrystalline silicon
Lifetime-limiting defects in monocrystalline silicon
Engineering of Highly Coherent Silicon Vacancy Defects in Silicon Carbide