Nanoscale electrical characterization of graphene-based materials by atomic force microscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2044-5326
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
-
online resource.
- Bibliographic citation
-
Nanoscale electrical characterization of graphene-based materials by atomic force microscopy ; volume:37 ; number:20 ; day:6 ; month:10 ; year:2022 ; pages:3319-3339 ; date:10.2022
Journal of materials research ; 37, Heft 20 (6.10.2022), 3319-3339, 10.2022
- Creator
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Silva, K. Kanishka H. De
Huang, Hsin-Hui
Viswanath, Pamarti
Joshi, Rakesh
Yoshimura, Masamichi
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1557/s43578-022-00758-0
- URN
-
urn:nbn:de:101:1-2023012422524257643356
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:28 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Silva, K. Kanishka H. De
- Huang, Hsin-Hui
- Viswanath, Pamarti
- Joshi, Rakesh
- Yoshimura, Masamichi
- SpringerLink (Online service)
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