Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: 10.1109/TIA.2022.3191632
- Klassifikation
-
Elektrotechnik, Elektronik
- Ereignis
-
Veröffentlichung
- (wo)
-
Aachen
- (wer)
-
Universitätsbibliothek der RWTH Aachen
- (wann)
-
2022
- Urheber
- DOI
-
10.18154/RWTH-2022-11359
- URN
-
urn:nbn:de:101:1-2023051101333712078885
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:02 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Fritz, Niklas
- Kamp, Tobias
- Polom, Timothy A.
- Friedel, Maximilian
- De Doncker, Rik W.
- Universitätsbibliothek der RWTH Aachen
Entstanden
- 2022
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