Study of the Boron Distribution and Microstructure of Solidified Al-Si Alloy During the Process of Silicon Purification
Abstract: The Al-Si melts that contain different silicon contents were solidified with a series of cooling rates, and the boron contents in primary silicon phases and eutectic silicon phases were measured and discussed. The results indicate that the boron content in the eutectic silicon phases is higher than that in the primary silicon phases when the cooling rate is constant. When the cooling rate decreases, the boron content in the primary silicon phases decreases, but the boron content in the eutectic silicon phases increases. The microstructure observations of solidified ingots show that there is an interface transition layer beside the primary silicon phase, and the average width of the interface transition layer increases with decreasing cooling rate.
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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Study of the Boron Distribution and Microstructure of Solidified Al-Si Alloy During the Process of Silicon Purification ; volume:37 ; number:1 ; year:2018 ; pages:69-73 ; extent:5
High temperature materials and processes ; 37, Heft 1 (2018), 69-73 (gesamt 5)
- Urheber
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Li, Yanlei
Chen, Jian
Dai, Songyuan
- DOI
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10.1515/htmp-2016-0090
- URN
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urn:nbn:de:101:1-2501280309515.300746122591
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:25 MESZ
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Beteiligte
- Li, Yanlei
- Chen, Jian
- Dai, Songyuan
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