Werke:
- Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs
- Process implications on the stability and reliability of 300 mm FAB MoS2 field-effect transistors
- Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
- A review of recent advances in the spherical harmonics expansion method for semiconductor device simulation
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