Minority carrier lifetime monitoring in a buried contact solar cells process using MC-SI
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
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Englisch
- Notes
-
In: The compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference. - München : WIP Renewable Energies, 2008. - S. 1564-1567
In: 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, 1. Sep 2008 - 5. Sep 2008, Valencia, Spain
- Classification
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Industrielle und handwerkliche Fertigung
- Event
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Veröffentlichung
- (where)
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Konstanz
- (who)
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Bibliothek der Universität Konstanz
- (when)
-
2008
- Creator
- URN
-
urn:nbn:de:bsz:352-opus-122216
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:53 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Raabe, Bernd
- Peter, Kristian
- Enabakk, Erik
- Hahn, Giso
- Bibliothek der Universität Konstanz
Time of origin
- 2008
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Status of selective emitter technology
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Silicon Nitride Deposition : Impact on Lifetime and Light-Induced Degradation at Elevated Temperature in Multicrystalline Silicon
Temperature induced degradation of the contact resistance of Ag-screen printed p-type silicon solar cells
Automatic etch pit density analysis in multicrystalline silicon
Increased internal quantum efficiency of encapsulated solar cells by using two-component silicone as encapsulant material
Mapping of hydrogen bond energies in EFG silicon samples by analysis of spatially resolved minority charge carrier lifetimes after annealing steps
Injection resolved spatial lifetime mapping using photoluminescence
Status of selective emitter technology
Bulk passivation in silicon ribbons : a lifetime study for an enhanced high efficiency process
12,5% efficient RGS silicon solar cells with carrier collecting channels
Long-term carrier lifetime instabilities in n-type FZ- and Cz-silicon under illumination at elevated temperature
Evaluation of processing steps regarding lifetime of iron/copper contaminated mc Si wafers
Comparison of buried contact- and screen printed 100% UMG solar cells resulting in 16.2% efficiency
Silicon Nitride Deposition : Impact on Lifetime and Light-Induced Degradation at Elevated Temperature in Multicrystalline Silicon
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