High resolution slope measuring deflectometry for the characterization of ultra-precise reflective X-ray optics
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
Innovation in mechanical engineering - shaping the future : proceedings ; 1.1.[02]
International scientific colloquium / Ilmenau University of Technology ; 56
- Classification
-
Ingenieurwissenschaften und Maschinenbau
- Event
-
Veröffentlichung
- (where)
-
Ilmenau
- (who)
-
Universitätsbibliothek Ilmenau
- (when)
-
2011
- Contributor
-
Siewert, Frank
Buchheim, Jana
Höft, Tobias
Fiedler, Stefan
Bourenkov, Gleb
Cianci, Michele
Signorato, Riccardo
Universitätsbibliothek
- URN
-
urn:nbn:de:gbv:ilm1-2011iwk-136:7
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:22 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Siewert, Frank
- Buchheim, Jana
- Höft, Tobias
- Fiedler, Stefan
- Bourenkov, Gleb
- Cianci, Michele
- Signorato, Riccardo
- Universitätsbibliothek
- Universitätsbibliothek Ilmenau
Time of origin
- 2011
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Advanced X-ray multilayer waveguide optics
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X-ray waveguide optics : beyond straight channels
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Optics for Nano-Satellite X-Ray Monitor
Optimizing Selective Laser Melting for Reflective Optics
Additive manufacturing of reflective optics: Evaluating finishing methods
Development of a reflective stereo slope gauge for the measurement of ocean surface wave slope statistics
Hard X-ray waveguide optics
Sensor Fusion for Precise Mapping of Transparent and Specular Reflective Objects
Advanced X-ray multilayer waveguide optics
Advanced x-ray multilayer waveguide optics
Advanced x-ray multilayer waveguide optics
X-ray imaging with high numerical aperture X-ray optics
X-ray waveguide optics : beyond straight channels
X-ray waveguide optics : Beyond straight channels