- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
4431703365
- Dimensions
-
27 cm
- Extent
-
IX, 152 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Literaturangaben
- Keyword
-
Durchstrahlungselektronenmikroskopie
- Event
-
Veröffentlichung
- (where)
-
Tokyo, Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris
- (who)
-
Springer
- (when)
-
2002
- Creator
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 2:01 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Shindo, Daisuke
- Oikawa, Tetsuo
- Springer
Time of origin
- 2002
Other Objects (12)
Practical analytical electron microscopy in materials science
High resolution electron microscopy for materials science
Characterization of microstructures by analytical electron microscopy (AEM)
Materials Testing - Scanning Electron Microscopy
Analytical transmission electron microscopy in materials science : fundamentals and techniques ; held in Halle/Saale, September 26th - October 1st, 1993
In-situ electron microscopy : applications in physics, chemistry and materials science
ChemiTEM – Transmission Electron Microscopy Optimized for Chemistry and Material Science
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Bridging fluorescence microscopy and electron microscopy
Transmission electron microscopy and diffractometry of materials
Gas-phase electron microscopy for materials research
Analytical transmission electron microscopy in steels : from microstructure characterization to phase transformation mechanisms
Practical analytical electron microscopy in materials science
High resolution electron microscopy for materials science
Characterization of microstructures by analytical electron microscopy (AEM)
Materials Testing - Scanning Electron Microscopy
Analytical transmission electron microscopy in materials science : fundamentals and techniques ; held in Halle/Saale, September 26th - October 1st, 1993
In-situ electron microscopy : applications in physics, chemistry and materials science
ChemiTEM – Transmission Electron Microscopy Optimized for Chemistry and Material Science
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Bridging fluorescence microscopy and electron microscopy
Transmission electron microscopy and diffractometry of materials
Gas-phase electron microscopy for materials research
Analytical transmission electron microscopy in steels : from microstructure characterization to phase transformation mechanisms
Practical analytical electron microscopy in materials science
High resolution electron microscopy for materials science
Characterization of microstructures by analytical electron microscopy (AEM)
Materials Testing - Scanning Electron Microscopy
Analytical transmission electron microscopy in materials science : fundamentals and techniques ; held in Halle/Saale, September 26th - October 1st, 1993
In-situ electron microscopy : applications in physics, chemistry and materials science
ChemiTEM – Transmission Electron Microscopy Optimized for Chemistry and Material Science
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Bridging fluorescence microscopy and electron microscopy
Transmission electron microscopy and diffractometry of materials
Gas-phase electron microscopy for materials research