Broadband reflectometry for enhanced diagnostics and monitoring applications
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783642267970
9783642202322
3642202322
- Maße
-
24 cm
- Umfang
-
XVIII, 148 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Erschienen in
-
Lecture notes in electrical engineering ; Vol. 93
- Schlagwort
-
Frequenzbereichsreflektometrie
Zeitbereichsreflektometrie
Mikrowellentechnik
Impedanzspektroskopie
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin, Heidelberg
- (wer)
-
Springer
- (wann)
-
2011
- Urheber
-
Cataldo, Andrea
De Benedetto, Egidio
Cannazza, Giuseppe
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:07 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Cataldo, Andrea
- De Benedetto, Egidio
- Cannazza, Giuseppe
- Springer
Entstanden
- 2011
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