Anomalous thickness dependence of the Hall effect in ultrathin Pb layers on Si(111)

to connected objects

Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: In: Vilfan, I.; Henzler, M.; Pfennigstorf, O.; Pfnür, H.: Anomalous thickness dependence of the Hall effect in ultrathin Pb layers on Si(111). In: Physical Review B 66 (2002), Nr. 24, S. 1-4. DOI: https://doi.org/10.1103/PhysRevB.66.241306

Event: Veröffentlichung

(where): Hannover, Hannover

(who): Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)

(when): 2002

DOI: 10.15488/2785

URN: urn:nbn:de:101:1-2020060413180816546949

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 25.03.2025, 1:57 PM CET

Data provider

This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.

Show original at data provider

Associated

Gottfried Wilhelm Leibniz Universität Hannover, Technische Informationsbibliothek (TIB)

Time of origin

2002

Other Objects (12)

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films

Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Energy dependence of pion and kaon production in central Pb+Pb collisions

Anomalous temperature dependence of multiple Andreev reflections in a topological insulator Josephson junction

Origin of anomalous temperature dependence and high efficiency of silicon light-emitting diodes

Thickness-dependence of the breakdown strength: analysis of the dielectric and mechanical failure

Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films

Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Energy dependence of pion and kaon production in central Pb+Pb collisions

Anomalous temperature dependence of multiple Andreev reflections in a topological insulator Josephson junction

Origin of anomalous temperature dependence and high efficiency of silicon light-emitting diodes

Thickness-dependence of the breakdown strength: analysis of the dielectric and mechanical failure

Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co2MnGa thin films

Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Energy dependence of pion and kaon production in central Pb+Pb collisions

Anomalous temperature dependence of multiple Andreev reflections in a topological insulator Josephson junction

Origin of anomalous temperature dependence and high efficiency of silicon light-emitting diodes

Thickness-dependence of the breakdown strength: analysis of the dielectric and mechanical failure

Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Cultural heritage institutions wishing to register will find more information here.

Fields marked * need to be filled in.

Username*

Please enter your username

Email*

Please enter your email address

Please do not fill this field

First name

Last name

Password*

Please enter your password

Confirm password*

Please enter the same password

I have read the terms of use and the privacy policy for the collection of personal data and accept them. *

This field is required.

I would like to subscribe to the newsletter of the Deutsche Digitale Bibliothek. See newsletter subscription info.

Account created

Your "My DDB" account has been successfully created. Before you can log in to your account, you must click the confirmation link in the message we just sent to the email address you provided.

Anomalous thickness dependence of the Hall effect in ultrathin Pb layers on Si(111)

Object Details

References and Relationships

Contributors, Places and Time

Further information

Data provider

Associated

Time of origin

Other Objects (12)

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co<sub>2</sub>MnGa thin films

Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Energy dependence of pion and kaon production in central Pb+Pb collisions

Anomalous temperature dependence of multiple Andreev reflections in a topological insulator Josephson junction

Origin of anomalous temperature dependence and high efficiency of silicon light-emitting diodes

Thickness-dependence of the breakdown strength: analysis of the dielectric and mechanical failure

Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co<sub>2</sub>MnGa thin films

Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Energy dependence of pion and kaon production in central Pb+Pb collisions

Anomalous temperature dependence of multiple Andreev reflections in a topological insulator Josephson junction

Origin of anomalous temperature dependence and high efficiency of silicon light-emitting diodes

Thickness-dependence of the breakdown strength: analysis of the dielectric and mechanical failure

Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Thickness dependence of the anomalous Nernst effect and the Mott relation of Weyl-semimetal Co<sub>2</sub>MnGa thin films

Antiferromagnetic layer thickness dependence of the IrMn/Co exchange-bias system

Thickness dependence of the integrated Bragg intensity for statistically disturbed silicon crystals

High resolution surface plasmon measurements - a sensitive probe for thickness and structural information of ultrathin films

Energy dependence of pion and kaon production in central Pb+Pb collisions

Anomalous temperature dependence of multiple Andreev reflections in a topological insulator Josephson junction

Origin of anomalous temperature dependence and high efficiency of silicon light-emitting diodes

Thickness-dependence of the breakdown strength: analysis of the dielectric and mechanical failure

Thickness dependence of the magnetic properties of ripple-patterned Fe/MgO(001) films

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Anomalous evolution of the near-side jet peak shape in Pb–Pb collisions at √sNN = 2.76 TeV

Related objects

Reset password