- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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1 Online-Ressource.
- Sprache
-
Englisch
- Erschienen in
-
Electronic correlations in epitaxial CrN thin film ; volume:13 ; number:1 ; day:25 ; month:9 ; year:2023 ; pages:1-9 ; date:12.2023
Scientific reports ; 13, Heft 1 (25.9.2023), 1-9, 12.2023
- Urheber
-
Kalal, Shailesh
Nayak, Sanjay
Sahoo, Sophia
Joshi, Rajeev
Choudhary, Ram Janay
Rawat, Rajeev
Gupta, Mukul
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
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10.1038/s41598-023-42733-7
- URN
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urn:nbn:de:101:1-2024020512382323589726
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:33 MESZ
Datenpartner
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Beteiligte
- Kalal, Shailesh
- Nayak, Sanjay
- Sahoo, Sophia
- Joshi, Rajeev
- Choudhary, Ram Janay
- Rawat, Rajeev
- Gupta, Mukul
- SpringerLink (Online service)
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Failure stress of epitaxial silicon thin films
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Epitaxial growth of Gd₂₋ₓCeₓCuO₄ thin films
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