Transmission increase upon switching VO2 thin films on microstructured surfaces
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Applied Physics Letters ; 91 (2007). - 091907
- Classification
-
Physik
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
Bibliothek der Universität Konstanz
- (when)
-
2008
- Contributor
- URN
-
urn:nbn:de:bsz:352-opus-65811
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:02 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Karakurt, Ismail
- Boneberg, Johannes
- Leiderer, Paul
- López, René
- Halabica, Andrej
- Haglund, Richard
- Bibliothek der Universität Konstanz
Time of origin
- 2008
Other Objects (12)
Nonreciprocal switching of VO2 thin films on microstructured surfaces
Electrochromic switching of WO3 nanostructures and thin films
On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films
Optical near-field imaging and nanostructuring by means of laser ablation
Surface-plasmon-enhanced multiple-photon photoemission from Ag and Al films
Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
Femtosecond laser near field ablation
Mit Kapillarkräften zu Nanostrukturen : wie man die Selbstorganisation von Kolloidkügelchen für die Submikrometer-Lithographie nutzen kann
Size-Dependent Self-Organization of Colloidal Particles on Chemically Patterned Surfaces
A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale
Nanostructuring on WSe2 with the atomic force microscope by a potential controlled electrochemical reaction
Dynamics of the solidification of laser-annealed Si thin films
Nonreciprocal switching of VO2 thin films on microstructured surfaces
Electrochromic switching of WO3 nanostructures and thin films
On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films
Optical near-field imaging and nanostructuring by means of laser ablation
Surface-plasmon-enhanced multiple-photon photoemission from Ag and Al films
Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
Femtosecond laser near field ablation
Mit Kapillarkräften zu Nanostrukturen : wie man die Selbstorganisation von Kolloidkügelchen für die Submikrometer-Lithographie nutzen kann
Size-Dependent Self-Organization of Colloidal Particles on Chemically Patterned Surfaces
A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale
Nanostructuring on WSe2 with the atomic force microscope by a potential controlled electrochemical reaction
Dynamics of the solidification of laser-annealed Si thin films
Nonreciprocal switching of VO2 thin films on microstructured surfaces
Electrochromic switching of WO3 nanostructures and thin films
On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films
Optical near-field imaging and nanostructuring by means of laser ablation
Surface-plasmon-enhanced multiple-photon photoemission from Ag and Al films
Nanosecond time-resolved reflectivity determination of the melting of metals upon pulsed laser annealing
Femtosecond laser near field ablation
Mit Kapillarkräften zu Nanostrukturen : wie man die Selbstorganisation von Kolloidkügelchen für die Submikrometer-Lithographie nutzen kann
Size-Dependent Self-Organization of Colloidal Particles on Chemically Patterned Surfaces
A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale
Nanostructuring on WSe2 with the atomic force microscope by a potential controlled electrochemical reaction