Tailoring threshold voltage of R2R printed SWCNT thin film transistors for realizing 4 bit ALU

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
1 Online-Ressource.
Language
Englisch

Bibliographic citation
Tailoring threshold voltage of R2R printed SWCNT thin film transistors for realizing 4 bit ALU ; volume:8 ; number:1 ; day:20 ; month:11 ; year:2024 ; pages:1-11 ; date:12.2024
npj flexible electronics ; 8, Heft 1 (20.11.2024), 1-11, 12.2024

Classification
Elektrotechnik, Elektronik

Creator
Parajuli, Sajjan
Jung, Younsu
Shrestha, Sagar
Park, Jinhwa
Ahn, Chanyeop
Shrestha, Kiran
Maskey, Bijendra Bishow
Cho, Tae-Yeon
Eom, Ji-Ho
Lee, Changwoo
Kong, Jeong-Taek
Kim, Byung-Sung
Lee, Taik-Min
Kim, SoYoung
Cho, Gyoujin
Contributor
SpringerLink (Online service)

DOI
10.1038/s41528-024-00369-1
URN
urn:nbn:de:101:1-2502062122551.731824338834
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:29 AM CEST

Data provider

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Associated

  • Parajuli, Sajjan
  • Jung, Younsu
  • Shrestha, Sagar
  • Park, Jinhwa
  • Ahn, Chanyeop
  • Shrestha, Kiran
  • Maskey, Bijendra Bishow
  • Cho, Tae-Yeon
  • Eom, Ji-Ho
  • Lee, Changwoo
  • Kong, Jeong-Taek
  • Kim, Byung-Sung
  • Lee, Taik-Min
  • Kim, SoYoung
  • Cho, Gyoujin
  • SpringerLink (Online service)

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