Tailoring threshold voltage of R2R printed SWCNT thin film transistors for realizing 4 bit ALU
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Tailoring threshold voltage of R2R printed SWCNT thin film transistors for realizing 4 bit ALU ; volume:8 ; number:1 ; day:20 ; month:11 ; year:2024 ; pages:1-11 ; date:12.2024
npj flexible electronics ; 8, Heft 1 (20.11.2024), 1-11, 12.2024
- Classification
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Elektrotechnik, Elektronik
- Creator
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Parajuli, Sajjan
Jung, Younsu
Shrestha, Sagar
Park, Jinhwa
Ahn, Chanyeop
Shrestha, Kiran
Maskey, Bijendra Bishow
Cho, Tae-Yeon
Eom, Ji-Ho
Lee, Changwoo
Kong, Jeong-Taek
Kim, Byung-Sung
Lee, Taik-Min
Kim, SoYoung
Cho, Gyoujin
- Contributor
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SpringerLink (Online service)
- DOI
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10.1038/s41528-024-00369-1
- URN
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urn:nbn:de:101:1-2502062122551.731824338834
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:29 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Parajuli, Sajjan
- Jung, Younsu
- Shrestha, Sagar
- Park, Jinhwa
- Ahn, Chanyeop
- Shrestha, Kiran
- Maskey, Bijendra Bishow
- Cho, Tae-Yeon
- Eom, Ji-Ho
- Lee, Changwoo
- Kong, Jeong-Taek
- Kim, Byung-Sung
- Lee, Taik-Min
- Kim, SoYoung
- Cho, Gyoujin
- SpringerLink (Online service)